One problem associated with microcavity devices is the significant difference between the reflection spectra of fabricated porous silicon microcavity (PSM) devices and those obtained by theoretical calculation of ideal microcavity devices. To address this problem, studies were carried out to determine the effects of the refractive index dispersion, the absorption of the porous silicon layer and the fluctuation of the dielectric interface on the reflection spectra of PSM devices. The results are in good agreement with those obtained experimentally from the fabricated PSM devices, which provides a theoretical basis for the design of PSM sensors.

基于双相位编码光学联合变换相关技术提出了一种测量透镜中心偏差的方法以确定偏差方向并提高测量精度。在经典联合变换相关原理基础之上，使用两个相位函数分别对参考图像和联合功率谱进行编码，并选用合适的滤波器消除旁瓣干扰，得到单个互相关峰的输出。利用该双相位编码后的联合变换相关技术探测不同目标图像相对于参考图像的位移矢量，并拟合圆。此拟合圆圆心到圆上点的矢量即为经自准直光学系统放大后的偏心矢量，从而同时确定了中心偏差的大小和方向。实验结果表明，通过双相位编码后的相关输出仅保留一个尖锐的相关峰，实现了位移矢量的亚像元探测; 使用联合变换相关技术准确地测量了透镜的中心偏差，其测量结果的实验标准差为0.1 μm,误差绝对值最大为0.3 μm, 满足一般透镜中心偏差测量的要求。